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Journal of Applied Physics

Volumn 105, Issue 6, 2009, Pages

Congruent charge-injection spectrum from independent measurements of fatigue and imprint in ferroelectric thin films

(2) Jiang, A Q a Tang, T A a

a FUDAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EQUATIONS; APPLIED VOLTAGES; BIASING VOLTAGES; DIRECT MEASUREMENTS; ELECTRODE CHARGES; FUNDAMENTAL PHYSICS; INDEPENDENT MEASUREMENTS; INITIAL TIME; ORDERS OF MAGNITUDES; PASSIVE LAYERS; PB(ZR ,TI)O; SCHOTTKY EMISSIONS; THIN-FILM CAPACITORS; TIME SPANS;

CHARGE INJECTION; EMISSION SPECTROSCOPY; FERROELECTRIC THIN FILMS; FERROELECTRICITY; LEAD; PLATINUM; THIN FILM CIRCUITS; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 63749092085 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3055401 Document Type: Article

Times cited : (7)

References (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.