Measurements of an EMC test chip for lower EME in CMOS digital circuits

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 2008, Pages

  Zhou, Junfeng ^a   Dehaene, Wim ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; EMISSION CONTROL; TIMING CIRCUITS;

AUTOMOTIVE MARKETS; CMOS DIGITAL CIRCUITS; DESIGN TECHNIQUE; DIGITAL DESIGNS; EMISSION REDUCTION; LOWER EMISSIONS; MEASUREMENTS OF; SUPPLY CURRENTS;

ELECTROMAGNETIC COMPATIBILITY;

EID: 63549148838     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMCEUROPE.2008.4786893     Document Type: Conference Paper

References (12)

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