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Volumn B, Issue , 2003, Pages 1143-1146

The influence of surface preparation on rear surface passivation of mc-Si by thermally treated direct PECVD silicon nitride

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRAPPING DENSITY; DIFFUSION MECHANISM; GAS FLOW RATIO; SURFACE PASSIVATION;

EID: 6344265429     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (13)
  • 4
    • 6344279020 scopus 로고    scopus 로고
    • Munich, Germany
    • th EPSEC; Munich, Germany; 2001; pp. 1768-1771
    • (2001) th EPSEC , pp. 1768-1771
    • Schneider, A.1
  • 7
    • 6344244912 scopus 로고    scopus 로고
    • New Orleans, USA
    • th IEEE-PVSC; New Orleans, USA; 2002; pp. 344-347
    • (2002) th IEEE-PVSC , pp. 344-347
    • Hauser, A.1
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.