Lattice strain effects in the measurement of the Si lattice parameter by Laue-case double-crystal diffractometry

Journal of Applied Crystallography

Volumn 37, Issue 5, 2004, Pages 773-777

  Mana, Giovanni ^a   Palmisano, Carlo ^b   Zosi, Gianfranco ^b  

^a Istituto di Metrologia Gustavo Colonnetti   (Italy)

^b UNIVERSITY OF TURIN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ANALYTIC METHOD; ARTICLE; CRYSTAL DIFFRACTOMETRY; CRYSTAL STRUCTURE; DIFFRACTION; INTERFEROMETRY; MATHEMATICAL MODEL; MEASUREMENT; PHASE SEPARATION; RESEARCH; SIMULATION; STRAIN DIFFERENCE; X RAY CRYSTALLOGRAPHY;

EID: 6344262072     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804016310     Document Type: Article

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