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Volumn A, Issue , 2003, Pages 947-950

Defect characterization by temperature and injection-dependent lifetime spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLES; LIFETIME SPECTROSCOPY; SINTON CONSULTING INC (CO); TEMPERATURE AND INJECTION-DEPENDENT LIFETIME SPECTROSCOPY (TIDLS);

EID: 6344249011     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (19)
  • 19
    • 0001813685 scopus 로고
    • edited by S. T. Pantelides, 2nd ed. (Gordon and Breach Science Publishers, Yverdon, Switzerland)
    • H. G. Grimmeiss and E. Janzén, in Deep Centers in Semiconductors, edited by S. T. Pantelides, 2nd ed. (Gordon and Breach Science Publishers, Yverdon, Switzerland, 1992), p.87.
    • (1992) Deep Centers in Semiconductors , pp. 87
    • Grimmeiss, H.G.1    Janzén, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.