Synthesis and characterization of a large amount of branched Ni 2Si nanowires

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 8, 2004, Pages 1853-1856

  Yan, X Q ^a   Yuan, H J ^a   Wang, J X ^a   Liu, D F ^a   Zhou, Z P ^a   Gao, Y ^a   Song, L ^a   Liu, L F ^a   Zhou, W Y ^a   Wang, G ^a   Xie, S S ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; NICKEL COMPOUNDS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SILICON; SPECTROMETERS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); ORTHORHOMBIC PHASES; RAMAN SPECTROMETERS; THERMAL CHEMICAL VAPOR DEPOSITION;

NANOSTRUCTURED MATERIALS;

EID: 6344222993     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2907-4     Document Type: Article

References (15)

1. W.Z. Li, S.S. Xie, L.X. Qian, B.H. Chang, B.S. Zou, W.Y. Zhou, R.A. Zhao, G. Wang: Science 274, 1701 (1996)
2. Z.L. Wang, R.P. Gao, J.L. Gole, J.D. Stout: Adv. Mater. 12, 1938 (2000)
3. N. Wang, Y.H. Tang, Y.F. Zhang, C.S. Lee, I. Bello, S.T. Lee: Chem. Phys. Lett. 299, 237 (1999)
4. D.D.D. Ma, C.S. Lee, F.C.K. Au, S.Y. Tong, S.T. Lee: Science 299, 1874 (2003)
5. Z.W. Pan, Z.R. Dai, Z.L. Wang: Science 291, 1947 (2001)
6. S.H. Sun, G.W. Meng, Y.W. Wang, T. Gao, M.G. Zhang, Y.T. Tian, X.S. Peng, L.D. Zhang: Appl. Phys. A 76, 287 (2003)
7. J.K Jian, X.L. Chen, W.J. Wang, L. Dai, Y.P. Xu: Appl. Phys. A 76, 291 (2003)
8. Y.Q. Zhu, W.B. Hu, W.K. Hsu, M. Terrones, N. Grobert, J.P. Hare, H.W. Kroto, D.R.M. Walton, H. Terrones: Chem. Phys. Lett. 309, 327 (1999)
9. A.M. Morales, C.M. Lieber: Science 279, 208 (1998)
10. J. Crofton, P.G. Mcmullin, J.R. Williams, M.J. Bozack: J. Appl. Phys. 77, 1317 (1995)
11. T. Ohguro, S. Nakajima, M. Koike, T. Morimoto, A. Nishiyama, Y. Ushiku, T. Yoshitomi, M. Saito, H. Iwai: IEEE Trans. Electron Devices 41, 2305 (1994)
12. M.K. Datta, S.K. Pabi, B.S. Murty: J. Appl. Phys. 87, 8393 (2000)
13. G. Palasantzas, B. Ilge, J. De Nijs, L.J. Geerligs: J. Appl. Phys. 85, 1907 (1999)
14. K. Toman: Acta Crystallogr. 5, 329 (1952)
15. P.S. Lee, D. Mangelinck, K.L. Pey, Z.X. Shen, J. Ding, T. Osipowicz, A. See: Electrochem. Solid State Lett. 3, 153 (2000)