Simultaneous quality and reliability optimization for microengines subject to degradation

IEEE Transactions on Reliability

Volumn 58, Issue 1, 2009, Pages 98-105

  Peng, Hao ^a   Feng, Qianmei ^a   Coit, David W ^b  

^a UNIVERSITY OF HOUSTON   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

Burn in; MEMS reliability; Preventive replacement; Quality and reliability optimization; Specification limits; Wear degradation

Indexed keywords

DEGRADATION; INDUSTRIAL APPLICATIONS; INSPECTION; MEMS; MICROELECTROMECHANICAL DEVICES; OPTIMIZATION; RELIABILITY; SPECIFICATIONS;

BURN-IN; MEMS RELIABILITY; PREVENTIVE REPLACEMENT; QUALITY AND RELIABILITY OPTIMIZATION; SPECIFICATION LIMITS; WEAR DEGRADATION;

COMPOSITE MICROMECHANICS;

EID: 63149115234     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2008.2011672     Document Type: Article

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