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Volumn , Issue , 2008, Pages 450-456

Wafer level ACA packages and their applications to advanced electronic packaging

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; ADHESIVE PASTES; ANISOTROPY; APPLICATIONS; CONDUCTIVE FILMS; ELECTRONIC EQUIPMENT MANUFACTURE; FLAT PANEL DISPLAYS; FLIP CHIP DEVICES; GOLD; IMAGE SENSORS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; STUDS (STRUCTURAL MEMBERS); SUBSTRATES; TECHNOLOGY; THREE DIMENSIONAL; WAFER BONDING;

EID: 63049127162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2008.4763475     Document Type: Conference Paper
Times cited : (3)

References (9)
  • 5
    • 19944426124 scopus 로고    scopus 로고
    • Wafer-Applied Underfill: Flip-Chip Assembly and Reliability
    • R. Wayne Johnson et al., "Wafer-Applied Underfill: Flip-Chip Assembly and Reliability", IEEE Trans. On Electronics Packaging Manufacturing, vol. 27, no. 2, (2004), pp. 101-108.
    • (2004) IEEE Trans. On Electronics Packaging Manufacturing , vol.27 , Issue.2 , pp. 101-108
    • Wayne Johnson, R.1
  • 6
    • 33645562657 scopus 로고    scopus 로고
    • Flip Chip Assembly on Organic Boards Using Anisotropic Conductive Adhesives (ACAs) and Nickel/Gold Bumps
    • Singapore
    • th Electronic Packaging Technology Conference, Singapore, 2000, pp. 378-384.
    • (2000) th Electronic Packaging Technology Conference , pp. 378-384
    • Paik, K.W.1
  • 8
    • 0021430183 scopus 로고
    • Interaction of epoxy resins with water: The depression of glass transition temperature
    • May
    • T.S. Ellis and F.E. Karasz, "Interaction of epoxy resins with water: the depression of glass transition temperature", Polymer, vol. 25, May 1984, pp. 664-669.
    • (1984) Polymer , vol.25 , pp. 664-669
    • Ellis, T.S.1    Karasz, F.E.2
  • 9
    • 10444278084 scopus 로고    scopus 로고
    • The effect of Tg on thermo-mechanical deformation and reliability of adhesive flip chip assemblies during temperature cycling
    • W.S. Kwon et. al., "The effect of Tg on thermo-mechanical deformation and reliability of adhesive flip chip assemblies during temperature cycling", Proceedings of 54th Electronic Components and Technology Conference, 2004, pp. 1731-1737.
    • (2004) Proceedings of 54th Electronic Components and Technology Conference , pp. 1731-1737
    • Kwon, W.S.1    et., al.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.