Determination of thermal conductivity of thin layers used as transparent contacts and antireflection coatings with a photothermal method

Applied Optics

Volumn 48, Issue 7, 2009, Pages

  Kaźmierczak Bałata, Anna ^a   Bodzenta, Jerzy ^a   Korte Kobylińska, Dorota ^a   Mazur, Jacek ^b   Gołaszewska, Krystyna ^b   Kamińska, Eliana ^b   Piotrowska, Anna ^b  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; CONDUCTIVE FILMS; FILMS; HAFNIUM OXIDES; OXIDE FILMS; SUBSTRATES; THERMAL CONDUCTIVITY OF SOLIDS; THIN FILMS; ZINC OXIDE;

BULK MATERIALS; CONDUCTING OXIDES; HIGH DIELECTRIC CONSTANTS; ORDERS OF MAGNITUDE; PHOTO-THERMAL; PHOTOTHERMAL METHODS; SEMICONDUCTOR SUBSTRATE; THIN LAYERS;

THERMAL CONDUCTIVITY;

EID: 63049122392     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.000C74     Document Type: Article

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