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Volumn , Issue , 2008, Pages 149-152
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High density assembly technology using stacking method
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
ELECTRIC CONNECTORS;
MICROPROCESSOR CHIPS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
TECHNOLOGY;
3-DIMENSIONAL;
ASSEMBLY TECHNOLOGIES;
CMOS TECHNOLOGIES;
ELECTRICAL CONNECTIONS;
HIGH DENSITIES;
INTERCONNECTION METHODS;
INTERCONNECTION RESISTANCES;
MICRO BUMPS;
PROTOTYPE DEVICES;
SIDE PROCESS;
STACKING METHODS;
STACKING PROCESS;
THROUGH-SILICON-VIA;
WAFER STACKING;
WAFER STACKING TECHNOLOGIES;
WAFER THINNING;
CHIP SCALE PACKAGES;
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EID: 63049114565
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/VPWJ.2008.4762238 Document Type: Conference Paper |
Times cited : (4)
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References (6)
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