Growth and morphology of ultra-thin Al films on liquid substrates studied by atomic force microscopy

Thin Solid Films

Volumn 517, Issue 11, 2009, Pages 3408-3411

  Fang, Zheng Nong ^a   Yang, Bo ^a   Chen, Miao Gen ^a   Zhang, Chu Hang ^a   Xie, Jian Ping ^a   Ye, Gao Xiang ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Dynamic scaling analysis; Liquid substrates; Microstructure; Ultra thin film

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; ATOMS; BROWNIAN MOVEMENT; ELECTRODEPOSITION; LIQUIDS; METALLIC FILMS; MICROSTRUCTURE; SILICONES; SUBSTRATES; THIN FILM DEVICES; THIN FILMS;

AL FILMS; BROWNIAN MOTIONS; CONTINUOUS FILMS; DYNAMIC SCALING ANALYSIS; GROWTH EXPONENTS; GROWTH PROCESS; LIQUID SUBSTRATES; LIQUID SURFACES; MEAN SIZES; MORPHOLOGY EVOLUTIONS; PHYSICAL INTERPRETATIONS; ROUGHNESS EXPONENTS; SCALING BEHAVIORS; SELF-AFFINE SURFACES; SILICONE OIL; ULTRA-THIN FILM;

DYNAMIC ANALYSIS;

EID: 62849094269     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.017     Document Type: Article

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