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Volumn 92, Issue 3, 2009, Pages 732-737

Backscatter electron imaging and electron backscatter diffraction characterization of LaCoO3 during in situ compression

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION TESTING; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRONS; STRESSES;

EID: 62549124108     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.02937.x     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.