Nanotribological characterization system by AFM based controlled pushing

Proceedings of the IEEE Conference on Nanotechnology

Volumn 2001-January, Issue , 2001, Pages 99-104

  Sitti, Metin ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRICTION; GOLD COATINGS; MICROFABRICATION; NANOCANTILEVERS; NANOPARTICLES; NANOTECHNOLOGY; SUBSTRATES;

FRICTION BEHAVIOR; FRICTION CHARACTERIZATION; FRICTIONAL BEHAVIOR; FRICTIONAL COEFFICIENTS; MICROFABRICATED CANTILEVERS; NANO-SCALE OBJECTS; NANOTRIBOLOGICAL CHARACTERIZATION; SILICON SUBSTRATES;

ATOMIC FORCE MICROSCOPY;

EID: 84949232340     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2001.966401     Document Type: Conference Paper

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