Influence of oxygen deficiency on the out-of-plane tilt of epitaxial Y2O3 films on Ni-5% W tapes

Journal of Materials Research

Volumn 24, Issue 2, 2009, Pages 520-525

  Cantoni, C ^a   Specht, E D ^a   Goyal, A ^a   Li, X ^b   Rupich, M ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OXYGEN; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM ALLOYS;

BIAXIALLY TEXTURED; FILM/SUBSTRATE INTERFACES; INFLUENCE OF OXYGENS; INTERFACE DISLOCATIONS; OUT OF PLANES; OUT-OF-PLANE TEXTURES; OXYGEN CONTENTS; OXYGEN FLUXES; OXYGEN PRESSURES; OXYGEN STOICHIOMETRIES; RESIDUAL STRAINS; TILTING MECHANISMS; X- RAY DIFFRACTIONS;

OXYGEN VACANCIES;

EID: 61749091364     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0065     Document Type: Article

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