Imaging molecular orbitals by scanning tunneling microscopy on a passivated semiconductor

Nano Letters

Volumn 9, Issue 1, 2009, Pages 144-147

  Bellec, Amandine ^a,b   Francisco, Ample ^a,b   Riedel, Damien ^a,b   Dujardin, Gérald ^a,b   Joachim, Christian ^a,b  

^a CNRS   (France)

^b CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER ENERGIES; ELECTRONIC COUPLINGS; FREE MOLECULES; HIGHEST OCCUPIED MOLECULAR ORBITALS; LOW TEMPERATURES; PENTACENE; SCANNING TUNNELING MICROSCOPES; SI(100) SURFACE; SINGLE-MOLECULE ELECTRONICS;

CHEMICAL BONDS; ELECTRONIC PROPERTIES; ENGINEERING GEOLOGY; MOLECULAR MODELING; MOLECULAR ORBITALS; SCANNING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES;

MOLECULES;

NANOMATERIAL;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; GENETIC PROCEDURES; IMAGE ENHANCEMENT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; ULTRASTRUCTURE;

ELECTROCHEMISTRY; IMAGE ENHANCEMENT; MATERIALS TESTING; MICROSCOPY, SCANNING TUNNELING; MOLECULAR PROBE TECHNIQUES; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTORS;

EID: 61649119321     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl802688g     Document Type: Article

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