Development of electron phase microscopes

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 601, Issue 1-2, 2009, Pages 203-212

  Tonomura, Akira ^a,b,c  

^a HITACHI LTD   (Japan)

^b RIKEN   (Japan)

^c OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY GRADUATE UNIVERSITY   (Japan)

Author keywords

Electron holography; Electron phase microscopy; Field emission; Magnetic lines

Indexed keywords

ELECTRON BEAMS; ELECTRON HOLOGRAPHY; FIELD EMISSION; HOLOGRAPHIC INTERFEROMETRY; LORENTZ FORCE; MAGNETIC FIELD EFFECTS; OPTICAL MICROSCOPY; QUANTUM THEORY;

ELECTRON INTERFERENCES; EQUIPOTENTIAL LINES; HOLOGRAPHIC INTERFERENCE MICROSCOPIES; LORENTZ MICROSCOPIES; MAGNETIC LINES; MAGNETIC VORTICES; OPTICAL TECHNIQUES; QUANTUM MECHANICS;

ELECTRONS;

EID: 61549100578     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.12.201     Document Type: Article

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