Optical properties of metal nanoparticles as probed by photoemission electron microscopy

Journal of Applied Physics

Volumn 101, Issue 8, 2007, Pages

  Douillard, L ^a   Charra, F ^a   Fiorini, C ^a   Adam, P M ^b   Bachelot, R ^b   Kostcheev, S ^b   Lerondel, G ^b   De La Chapelle, M Lamy ^b   Royer, P ^b  

^a CEA SACLAY   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON MICROSCOPY; OPTICAL PROPERTIES; PHOTOEMISSION; SURFACE PLASMON RESONANCE; WAVELENGTH;

ELECTRON MOTION; LOCAL FIELD ENHANCEMENT; PHOTOEMISSION ELECTRON MICROSCOPY (PEEM); PLASMON MODES;

NANOPARTICLES;

EID: 34247859170     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2719282     Document Type: Conference Paper

References (25)

1. G. Mie, Ann. Phys. 25, 377 (1908).
2. U. Kreibig and M. Vollmer, Springer Series in Material Science (Springer, Berlin, 1995), Vol. 25.
3. P. Mulvaney, MRS Bull. 26, 1009 (2001).
4. A. D. McFarland and R. P. Van Duyne, Nano Lett. 1530-6984 10.1021/nl034372s 3, 1057 (2003).
5. W. L. Barnes, A. Dereux, and T. W. Ebbesen, Nature 0028-0836 10.1038/nature01937 424, 824 (2003).
6. S. A. Maier, P. G. Kik, H. A. Atwater, S. Meltzer, E. Harel, B. E. Koel, and A. A. G. Requicha, Nat. Mater. 1476-1122 10.1038/nmat852 2, 229 (2003).
7. G. P. Wiederrecht, Eur. Phys. J.: Appl. Phys. 1286-0042 10.1051/epjap:2004170 28, 3 (2004); F. Silly, A. O. Gusev, A. Taleb, F. Charra, and M. -P. Pileni, Phys. Rev. Lett. 84, 5840 (2000).
8. G. P. Wiederrecht, Eur. Phys. J.: Appl. Phys. 1286-0042 10.1051/epjap:2004170 28, 3 (2004); F. Silly, A. O. Gusev, A. Taleb, F. Charra, and M. -P. Pileni, Phys. Rev. Lett. 84, 5840 (2000).
9. P. Monchicourt, M. Raynaud, H. Saringar, and J. Kupersztych, J. Phys. Condens. Matter 0953-8984 10.1088/0953-8984/9/27/008 9, 5765 (1997).
10. M. Munzinger, C. Wiemann, M. Rohmer, L. Guo, M. Aeschlimann, and M. Bauer, N. J. Phys. 7, 68 (2005). 1367-2630
11. M. Cinchetti, A. Gloskovskii, S. A. Nepjiko, G. Schönhense, H. Rochholz, and M. Kreiter, Phys. Rev. Lett. 95, 47601 (2005). 0031-9007
12. A. Kubo, K. Onda, H. Petek, Z. Sun, Y. S. Jung, and H. K. Kim, Nano Lett. 1530-6984 10.1021/nl0506655 5, 1123 (2005).
13. The current LEEM/PEEM instrument works in total electron yield which increases its sensitivity at the price of a loss of spatial resolution originating from the energy spread of the electrons contributing to the image formation (chromatic aberration).
14. K. L. Kelly, E. Coronado, L. L. Zhao, and G. C. Schatz, J. Phys. Chem. B 1089-5647 10.1021/jp026731y 107, 668 (2003).
15. C. L. Haynes, A. D. McFarland, L. Zhao, R. P. Van Duyne, G. C. Schatz, L. Gunnarsson, J. Prikulis, B. Kasemo, and M. Käll, J. Phys. Chem. B 1089-5647 10.1021/jp034234r 107, 7337 (2003).
16. B. Lamprecht, G. Schider, R. T. Lechner, H. Ditlbacher, J. R. Krenn, A. Leitner, and F. R. Aussenegg, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.84. 4721 84, 4721 (2000).
17. A. Bouhelier, R. Bachelot, J. S. Im, G. P. Wiederrecht, G. Lerondel, S. Kostcheev, and P. Royer, J. Phys. Chem. B 1089-5647 10.1021/jp046224b 109, 3195 (2005).
18. N. Engheta, C. H. Papas, and C. Elachi, Radio Sci. 17, 1557 (1982) 0048-6604; J. E. Sipe, H. M. Vandriel, and I. F. Young, Can. J. Phys. 63, 104 (1985). 0008-4204
19. N. Engheta, C. H. Papas, and C. Elachi, Radio Sci. 17, 1557 (1982) 0048-6604; J. E. Sipe, H. M. Vandriel, and I. F. Young, Can. J. Phys. 63, 104 (1985). 0008-4204
20. J. Grand, P. -M. Adam, A. -S. Grimault, A. Vial, M. Lamy de la Chapelle, J. -L. Bijeon, S. Kostcheev, and P. Royer, Plasmonics 1, 135 (2006).
21. J. Lehmann, M. Merschdorf, W. Pfeiffer, A. Thon, S. Voll, and G. Gerber, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85.2921 85, 2921 (2000); W. Pfeiffer, C. Kennerknecht, and M. Merschdorf, Appl. Phys. A 0947-8396 10.1007/s00339-003-2428-6 78, 1011 (2004).
22. J. Lehmann, M. Merschdorf, W. Pfeiffer, A. Thon, S. Voll, and G. Gerber, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85.2921 85, 2921 (2000); W. Pfeiffer, C. Kennerknecht, and M. Merschdorf, Appl. Phys. A 0947-8396 10.1007/s00339-003-2428-6 78, 1011 (2004).
23. M. Cinchetti, D. A. Valdaitsev, A. Gloskovskii, A. Oelsner, S. A. Nepijko, and G. Schönhense, J. Electron Spectrosc. Relat. Phenom. 137-140, 249 (2004).
24. B. J. Messinger, K. Ulrich von Raben, R. K. Chang, and P. W. Barber, Phys. Rev. B 0163-1829 10.1103/PhysRevB.24.649 24, 649 (1981).
25. S. Benrezzak, P. -M. Adam, J. -L. Bijeon, and P. Royer, Surf. Sci. 0039-6028 10.1016/S0039-6028(01)01404-2 491, 195 (2001).