Alkali ion scattering from Ag(0 0 1) and Ag thin films at low and hyperthermal energies

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 4, 2009, Pages 615-619

  Ray, M P ^a   Lake, R E ^a   Sosolik, C E ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

Hot carriers; Hyperthermal energy; Ion beam effects; Ion scattering; Ion surface impact; Semiconductor device measurement

Indexed keywords

ATOMIC SPECTROSCOPY; ATOMS; CESIUM; CRYSTAL STRUCTURE; DYNAMICS; ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; HOT CARRIERS; ION BEAMS; MOLECULAR DYNAMICS; MOSFET DEVICES; PLASMA INTERACTIONS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR SWITCHES; SILICON WAFERS; SILVER; SINGLE CRYSTAL SURFACES; SPUTTERING;

HYPERTHERMAL ENERGY; ION BEAM EFFECTS; ION SCATTERING; ION-SURFACE IMPACT; SEMICONDUCTOR DEVICE MEASUREMENT;

IONS;

EID: 61349113320     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.11.037     Document Type: Article

References (32)

1. Kleyn A.W., and Horn T.C.M. Phys. Rep. 199 4 (1991) 192
2. Cooper B.H., and Behringer E.R. Low Energy Ion Surface Interactions (1994), John Wiley and Sons, New York
3. Cuenya B.R., Nienhaus H., and McFarland E.W. Phys. Rev. B 70 11 (2004) 115322
4. Glass S., and Nienhaus H. Phys. Rev. Lett. 93 16 (2004) 168302
5. Krix D., Nunthel R., and Nienhaus H. Phys. Rev. B 75 7 (2007) 073410
6. Nienhaus H., Bergh H.S., Gergen B., Majumdar A., Weinberg W.H., and McFarland E.W. Phys. Rev. Lett. 82 2 (1999) 446
7. Meyer S., Diesing D., and Wucher A. Phys. Rev. Lett. 93 13 (2004) 137601
8. Kovacs D.A., Peters T., Haake C., Schleberger M., Wucher A., Golczewski A., Aumayr F., and Diesing D. Phys. Rev. B 77 (2008) 245432
9. Schüller A., Wethekam S., and Winter H. Phys. Rev. Lett. 98 1 (2007) 016103
10. Schüller A., and Winter H. Phys. Rev. Lett. 100 9 (2008) 097602
11. Rousseau P., Khemliche H., Borisov A.G., and Roncin P. Phys. Rev. Lett. 98 1 (2007) 016104
12. Liu G.F., Sroubek Z., and Yarmoff J.A. Phys. Rev. Lett. 92 21 (2004) 216801
13. Liu G.F., Sroubek Z., Karmakar P., and Yarmoff J.A. J. Chem. Phys. 125 5 (2006) 054715
14. Horn T.C.M., Tenner A.D., Chang P.H., and Kleyn A.W. J. Electron Spectrosc. Relat. Phenom. 38 1-4 (1986) 81
15. Horn T.C.M., Haochang P., and Kleyn A.W. J. Vac. Sci. Technol. A 5 4 (1987) 656
16. Horn T.C.M., Pan H.C., Vandenhoek P.J., and Kleyn A.W. Surf. Sci. 201 3 (1988) 573
17. Horn T.C.M., Vanslooten U., and Kleyn A.W. Chem. Phys. Lett. 156 6 (1989) 623
18. Ray M.P., Lake R.E., Moody S.A., Magadala V., and Sosolik C.E. Rev. Sci. Instr. 79 7 (2008) 076106
19. Jiang C.S., Yu H., Shih C.K., and Ebert P. Surf. Sci. 518 1&2 (2002) 63
20. Tanikawa T., Matsuda I., Nagao T., and Hasegawa S. Surf. Sci. 493 1-3 (2001) 389
21. Hoegen M.H., Schmidt T., Meyer G., Winau D., and Rieder K.H. Phys. Rev. B 52 15 (1995) 10764
22. DiRubio C.A., McEachern R.L., McLean J.G., and Cooper B.H. Phys. Rev. B 54 12 (1996) 8862
23. Goodstein D.M., Langer S.A., and Cooper B.H. J. Vac. Sci. Technol. A 6 3 (1988) 703
24. M.P. Ray, R.E. Lake, C.E. Sosolik, Phys. Rev. B, submitted for publication.
25. Sosolik C.E., and Cooper B.H. Nucl. Instr. and Meth. B 182 1-4 (2001) 167
26. Yang M.C., Kim C., Lee H.W., and Kang H. Surf. Sci. 357&358 (1996) 595
27. Goodstein D.M., McEachern R.L., and Cooper B.H. Phys. Rev. B 39 18 (1989) 13129
28. Gergen B., Nienhaus H., Weinberg W.H., and McFarland E.W. Science 294 5551 (2001) 2521
29. Meyer S., Diesing D., and Wucher A. Phys. Rev. Lett. 93 13 (2004) 137601
30. Duvenbeck A., Weingart O., Buss V., and Wucher A. Nucl. Instr. and Meth. B 255 1 (2007) 281
31. Meyer S., Heuser C., Diesing D., and Wucher A. Phys. Rev. B 78 3 (2008) 035428
32. R.E. Lake, J.R. Puls, M.P. Ray, D.E. Dickel, A.M. Rao, C.E. Sosolik, Thin Solid Films, submitted for publication.