Crystallography of self-assembled DySi2 nanowires on a Si substrate

Applied Physics Letters

Volumn 94, Issue 8, 2009, Pages

  Qiu, Dong ^a   Zhang, Ming Xing ^a   Kelly, Patrick M ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTALLOGRAPHY; ELECTRIC WIRE; NANOWIRES; OPERATING ROOMS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SUBSTRATES;

CRYSTALLOGRAPHIC MODELS; EDGE-TO-EDGE MATCHING; EPITAXY SYSTEMS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPIES; INTERFACE ORIENTATIONS; KINETIC FACTORS; NANO STRUCTURES; ORIENTATION RELATIONSHIPS; SELF-ASSEMBLED; SI (1 1 1); SI SUBSTRATES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 61349113294     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3085772     Document Type: Article

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