Crystallographic study of self-assembled dysprosium silicide nanostructures on Si(001)

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 3, 2006, Pages

  Ye, Gangfeng ^a   Crimp, Martin A ^a   Nogami, Jun ^b  

^a Michigan State University   (United States)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746567830     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.033104     Document Type: Article

References (17)

1. C. Preinesberger, S. Vandre, T. Kalka, and M. Dahne-Prietsch, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/31/12/001 31, L43 (1998).
2. Y. Chen, D. A. A. Ohlberg, G. Medeiros-Ribeiro, Y. A. Chang, and R. S. Williams, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.126848 76, 4004 (2000).
3. J. Nogami, B. Z. Liu, M. V. Katkov, C. Ohbuchi, and N. O. Birge, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.63.233305 63, 233305 (2001).
4. G. Ye, J. Nogami, and M. A. Crimp, Thin Solid Films THSFAP 0040-6090 497, 48 (2006).
5. Z. He, M. Stevens, D. J. Smith, and P. A. Bennett, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1636244 83, 5292 (2003).
6. J. C. Chen, G. H. Shen, and L. J. Chen, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/S0169-4332(98)00639-4 142, 291 (1999).
7. Y. Chen, D. A. A. Ohlberg, and R. S. Williams, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1428807 91, 3213 (2002).
8. C. Ohbuchi and J. Nogami, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.66.165323 66, 165323 (2002).
9. H. W. Yeom, Y. K. Kim, E. Y. Lee, K.-D. Ryang, and P. G. Kang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95.205504 95, 205504 (2005).
10. K. Maex and M. Rossum, Properties of Metal Silicides (INSPEC, London, 1995).
11. B. Liu and J. Nogami, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1516621 93, 593 (2003).
12. T. B. Massalski, H. Okamoto, P. R. Subramanian, and L. Kacprzak, Binary Alloy Phase Diagrams (ASM International, Metals Park, OH, 1990).
13. B. C. Harrison and J. J. Boland, Surf. Sci. SUSCAS 0039-6028 594, 93 (2005).
14. Z. He, D. J. Smith, and P. A. Bennett, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.241402 70, 241402 (R) (2004).
15. J. C. Bravman and R. Sinclair, J. Electron Microsc. Tech. JEMTEC 0741-0581 1, 54 (1984).
16. D. B. Williams and C. B. Carter, Transmission Electron Microscopy (Plenum Publishing Corporation, New York, 1996).
17. E. Houssay, A. Rouault, O. Thomas, R. Madar, and J. P. Senateur, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/0169-4332(89)90531-X 38, 156 (1989).