Estimation of the thickness and the optical parameters of several stacked thin films using optimization

Applied Optics

Volumn 47, Issue 28, 2008, Pages 5208-5220

  Andrade, Ricardo ^a   Birgin, Ernesto G ^a   Chambouleyron, Ivan ^b   Martinez, Jose Mario ^b   Ventura, Sergio D ^c  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

^c FEDERAL RURAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSION (WAVES); DISPERSIONS; OPTICAL CONSTANTS; QUANTUM THEORY; REFRACTIVE INDEX; REVERSE ENGINEERING; WEBSITES;

COMPLEX REFRACTIVE INDEX; DISPERSION RELATIONS; MULTIPLE FILMS; OPTICAL PARAMETER; PHYSICAL CONSTRAINTS; RETRIEVAL ALGORITHMS; TRANSPARENT SUBSTRATE;

THIN FILMS;

EID: 60749119229     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.005208     Document Type: Article

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