Determination of thickness and optical constants of amorphous silicon films from transmittance data

Applied Physics Letters

Volumn 77, Issue 14, 2000, Pages 2133-2135

  Mulato, M ^a,d   Chambouleyron, I ^b   Birgin, E G ^c   Martinez, J M ^b  

^a Princeton University   (United States)

^b UNIVERSITY OF CAMPINAS   (Brazil)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

^d PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000044081     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1314299     Document Type: Article

References (8)

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