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Volumn , Issue , 2008, Pages 962-965
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Electrical properties of multilayer silicon nano-crystal nonvolatile memory
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS TECHNOLOGIES;
ELECTRICAL PROPERTIES;
GATE VOLTAGES;
MEMORY WINDOWS;
MULTI LAYERS;
NANOCRYSTAL NONVOLATILE MEMORIES;
NON-VOLATILE MEMORIES;
PROGRAM AND ERASE;
RELIABILITY PERFORMANCE;
SILICON NANOCRYSTALS;
TRANSIENT CHARACTERISTICS;
CMOS INTEGRATED CIRCUITS;
DATA STORAGE EQUIPMENT;
ELECTRIC PROPERTIES;
INTEGRATED CIRCUITS;
OPTICAL WAVEGUIDES;
NANOCRYSTALS;
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EID: 60649119212
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICSICT.2008.4734703 Document Type: Conference Paper |
Times cited : (1)
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References (13)
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