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Journal of Electroceramics

Volumn 22, Issue 1-3, 2009, Pages 203-208

Annealing temperature effect on ferroelectric and magnetic properties in Mn-added polycrystalline BiFeO3 films

(3) Naganuma, Hiroshi a Miura, Jun a Okamura, Soichiro a

a TOKYO UNIVERSITY OF SCIENCE (Japan)

Author keywords

BiFeO3; Ferroelectric property; Film; Magnetic property; Mn additive; Multiferroics

Indexed keywords

ANNEALING; DIFFRACTION; ELECTRIC FIELD EFFECTS; FERROELECTRIC FILMS; FERROELECTRICITY; HOLOGRAPHIC INTERFEROMETRY; MAGNETIC PROPERTIES; MAGNETISM; MAGNETS; MANGANESE; MANGANESE COMPOUNDS; POLARIZATION; TEMPERATURE; THERMAL EFFECTS;

ANNEALING TEMPERATURE EFFECTS; ANNEALING TEMPERATURES; APPLIED ELECTRIC FIELDS; BIFEO3; CONDUCTION MECHANISMS; DIFFRACTION PEAKS; FERROELECTRIC PROPERTY; HIGH ELECTRIC FIELDS; LEAKAGE CURRENT DENSITIES; MN ADDITIVE; MULTIFERROICS; OHMIC CONDUCTIONS; POLYCRYSTALLINE BIFEO; REMANENT POLARIZATIONS; ROOM TEMPERATURES; SECONDARY PHASE; SPONTANEOUS MAGNETIZATIONS; SPONTANEOUS POLARIZATIONS; X-RAY DIFFRACTION PATTERNS;

SEMICONDUCTING BISMUTH COMPOUNDS;

EID: 60649101887 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-007-9400-3 Document Type: Article

Times cited : (13)

References (21)

1
- 15444365837
- J.B. Neaton C. Ederer U.V. Waghmare N.A. Spaidin K.M. Rabe 2005 Phys. Rev. B 71 014113
- (2005) Phys. Rev. B , vol.71 , pp. 014113
- Neaton, J.B.¹ Ederer, C.² Waghmare, U.V.³ Spaidin, N.A.⁴ Rabe, K.M.⁵

2
- 29144507389
- C. Ederer N.A. Spaldin 2005 Phys. Rev. Lett 95 257601
- (2005) Phys. Rev. Lett , vol.95 , pp. 257601
- Ederer, C.¹ Spaldin, N.A.²

3
- 0037436499
- J. Wang J.B. Neaton H. Zheng V. Nagarajan S.B. Ogale B. Liu D. Viehland V. Vaithyanathan D.G. Schlom U.V. Waghmare N.A. Spaldin K.M. Rabe M. Wuttig R. Ramesh 2003 Science 299 1719
- (2003) Science , vol.299 , pp. 1719
- Wang, J.¹ Neaton, J.B.² Zheng, H.³ Nagarajan, V.⁴ Ogale, S.B.⁵ Liu, B.⁶ Viehland, D.⁷ Vaithyanathan, V.⁸ Schlom, D.G.⁹ Waghmare, U.V.¹⁰ Spaldin, N.A.¹¹ Rabe, K.M.¹² Wuttig, M.¹³ Ramesh, R.¹⁴

4
- 3142655788
- J. Li J. Wang M. Wuttig R. Ramesh N. Wang B. Ruette A.P. Pyatakov A.K. Zvezdin D. Viehland 2004 Appl. Phys. Lett 84 5261
- (2004) Appl. Phys. Lett , vol.84 , pp. 5261
- Li, J.¹ Wang, J.² Wuttig, M.³ Ramesh, R.⁴ Wang, N.⁵ Ruette, B.⁶ Pyatakov, A.P.⁷ Zvezdin, A.K.⁸ Viehland, D.⁹

5
- 60649106245
- J. Li J. Wang M. Wuttig R. Ramesh N. Wang B. Ruette A.P. Pyatakov A.K. Zvezdin D. Viehland 2004 Appl. Phys. Lett 84 5216
- (2004) Appl. Phys. Lett , vol.84 , pp. 5216
- Li, J.¹ Wang, J.² Wuttig, M.³ Ramesh, R.⁴ Wang, N.⁵ Ruette, B.⁶ Pyatakov, A.P.⁷ Zvezdin, A.K.⁸ Viehland, D.⁹

6
- 3142641245
- K.Y. Yun D. Ricinschi T. Kanashima M. Noda M. Okuyama 2004 Jpn. J. Appl. Phys 43 L647
- (2004) Jpn. J. Appl. Phys , vol.43 , pp. 647
- Yun, K.Y.¹ Ricinschi, D.² Kanashima, T.³ Noda, M.⁴ Okuyama, M.⁵

7
- 34547573298
- D. Lebeugle D. Colson A. Forget M. Viret P. Bonville J.F. Marucco S. Fusil 2007 Phys. Rev. Lett 76 024116
- (2007) Phys. Rev. Lett , vol.76 , pp. 024116
- Lebeugle, D.¹ Colson, D.² Forget, A.³ Viret, M.⁴ Bonville, P.⁵ Marucco, J.F.⁶ Fusil, S.⁷

8
- 60649115916
- In press
- H. Naganuma, Y. Inoue, S. Okamura, IEEE Trans. Ultrason. Ferroelectr. Freq. Control. In press (2007)
- (2007) IEEE Trans. Ultrason. Ferroelectr. Freq. Control.
- Naganuma, H.¹ Inoue, Y.² Okamura, S.³

9
- 18744378644
- X. Qi J. Dho R. Tomov M.G. Blamire J.L.M. Driscoll 2005 Appl. Phys. Lett 86 062903
- (2005) Appl. Phys. Lett , vol.86 , pp. 062903
- Qi, X.¹ Dho, J.² Tomov, R.³ Blamire, M.G.⁴ Driscoll, J.L.M.⁵

10
- 33745196901
- C.-F. Chung J.-P. Lin J.-M. Wu 2006 Appl. Phys. Lett 88 242909
- (2006) Appl. Phys. Lett , vol.88 , pp. 242909
- Chung, C.-F.¹ Lin, J.-P.² Wu, J.-M.³

11
- 33745625140
- S.K. Singh H. Ishiwara K. Maruyama 2006 Appl. Phys. Lett 88 262908
- (2006) Appl. Phys. Lett , vol.88 , pp. 262908
- Singh, S.K.¹ Ishiwara, H.² Maruyama, K.³

12
- 33846875281
- K. Takahashi M. Tonouchi 2006 Jpn. J. Appl. Phys 45 L755
- (2006) Jpn. J. Appl. Phys , vol.45 , pp. 755
- Takahashi, K.¹ Tonouchi, M.²

13
- 33645518835
- J.K. Kim S.S. Kim W.-J. Kim A.S. Bhalla R. Guo 2006 Appl. Phys. Lett 88 132901
- (2006) Appl. Phys. Lett , vol.88 , pp. 132901
- Kim, J.K.¹ Kim, S.S.² Kim, W.-J.³ Bhalla, A.S.⁴ Guo, R.⁵

14
- 33748452881
- Y. Wang C.-W. Nan 2006 Appl. Phys. Lett 89 052903
- (2006) Appl. Phys. Lett , vol.89 , pp. 052903
- Wang, Y.¹ Nan, C.-W.²

15
- 33846252715
- S.R. Shannigrahi A. Huang N. Chandrasekhar D. Tripathy A.O. Adeyeye 2007 Appl. Phys. Lett 90 022901
- (2007) Appl. Phys. Lett , vol.90 , pp. 022901
- Shannigrahi, S.R.¹ Huang, A.² Chandrasekhar, N.³ Tripathy, D.⁴ Adeyeye, A.O.⁵

16
- 28044456595
- H. Uchida R. Ueno H. Nakai H. Funakubo S. Koda 2005 Jpn. J. Appl. Phys 44 L561
- (2005) Jpn. J. Appl. Phys , vol.44 , pp. 561
- Uchida, H.¹ Ueno, R.² Nakai, H.³ Funakubo, H.⁴ Koda, S.⁵

17
- 20844441189
- D. Lee M.G. Kim S. Ryu H.M. Jang S.G. Lee 2005 Appl. Phys. Lett 86 222903
- (2005) Appl. Phys. Lett , vol.86 , pp. 222903
- Lee, D.¹ Kim, M.G.² Ryu, S.³ Jang, H.M.⁴ Lee, S.G.⁵

18
- 60649094164
- H. Naganuma A. Kovacs Y. Hirotsu Y. Inoue S. Okamura 2007 Trans. Mat. Res. Soc. Jpn 32 39
- (2007) Trans. Mat. Res. Soc. Jpn , vol.32 , pp. 39
- Naganuma, H.¹ Kovacs, A.² Hirotsu, Y.³ Inoue, Y.⁴ Okamura, S.⁵

19
- 35348963608
- H. Naganuma A. Kovacs A. Hirata Y. Hirotsu S. Okamura 2007 Mater. Trans 48 2370
- (2007) Mater. Trans , vol.48 , pp. 2370
- Naganuma, H.¹ Kovacs, A.² Hirata, A.³ Hirotsu, Y.⁴ Okamura, S.⁵

20
- 34248560760
- H. Naganuma S. Okamura 2007 J. Appl. Phys 101 09M103
- (2007) J. Appl. Phys , vol.101
- Naganuma, H.¹ Okamura, S.²

21
- 0005917783
- S. Nakamura S. Soeya N. Ikeda M. Tanaka 1993 J. Appl. Phys 74 5652
- (1993) J. Appl. Phys , vol.74 , pp. 5652
- Nakamura, S.¹ Soeya, S.² Ikeda, N.³ Tanaka, M.⁴

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