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Volumn 48, Issue 9, 2007, Pages 2370-2373

Structural analysis of polycrystalline BiFeO3 films by transmission electron microscopy

(5) Naganuma, Hiroshi a Kovacs, Andras b Hirata, Akihiko b Hirotsu, Yoshihiko b Okamura, Soichiro a

Author keywords

Bismuth iron oxide film; Crystal structure; Ferroelectric properties; Magnetic properties; Multiferroics; Transmission electron microscopy

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FOURIER TRANSFORMS; MAGNETIC PROPERTIES; POLYCRYSTALLINE MATERIALS; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

BISMUTH IRON OXIDE FILM; CHEMICAL SOLUTION DEPOSITION; ELECTRIC COERCIVE FIELD; FERROELECTRIC PROPERTIES; POST DEPOSITION ANNEALING;

THIN FILMS;

EID: 35348963608 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.MAW200782 Document Type: Article

Times cited : (6)

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