Development of a new traceable areal surface texture measuring instrument

Wear

Volumn 266, Issue 5-6, 2009, Pages 552-554

  Leach, R K ^a   Flack, D R ^a   Hughes, E B ^a   Jones, C W ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Areal; Surface texture; Traceability

Indexed keywords

BEARINGS (STRUCTURAL); INTERFEROMETERS; LABORATORIES; PROBES; SLIDEWAYS; SURFACE CHEMISTRY; TEXTURES;

AIR BEARINGS; AREAL; LASER INTERFEROMETERS; MEASURING INSTRUMENTS; NATIONAL PHYSICAL LABORATORIES; SUB-SYSTEMS; SURFACE TEXTURE; SURFACE TEXTURE MEASUREMENTS; TRACEABILITY; VERTICAL DISPLACEMENTS; WORKING VOLUMES;

INSTRUMENTS;

EID: 60449098315     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2008.04.072     Document Type: Article

References (6)

1. Leach R. Some issues of traceability in the field of surface texture measurement. Wear 257 (2007) 1246-1249
2. Haycocks J., Jackson K., Leach R., Garratt J., McDonnell I., Rubert P., Lamb J., and Wheeler S. Tackling the challenge of traceable surface texture measurement in three dimensions. Proceedings of 5th International Euspen Conference. Turin, Italy (2005 May) 253-256
3. Leach R. Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV. Meas. Sci. Technol. 11 (2000) 1162-1172
4. Thomsen-Schmidt P., and Krüger-Sehm R. Development of a new stylus system for roughness measurement. Proceedings of XI International Colloquium on Surfaces. Chemnitz, Germany (2004 February) 79-85
5. Bayliss D., Leach R., and Hall M. Development of an electromagnetic spring for use with a high accuracy surface texture measuring probe. NPL Report DEPC-EM 06 (2006) 1-9
6. Downs M., and Nunn J. Verification of the sub-nanometric capability of an NPL differential plane mirror interferometer with a capacitance probe. Meas. Sci. Technol. 9 (1998) 1437-1440