Tackling the challenge of traceable surface texture measurement in three dimensions.

EUSPEN 2005 - Proceedings of the 5th International Conference of the European Society for Precision Engineering and Nanotechnology

Volumn , Issue , 2005, Pages 253-256

  Haycocks, J ^a   Jackson, K ^a   Leach, R ^a   Garratt, J ^b   McDonnell, I ^b   Rubert, P ^c   Lamb, J ^d   Wheeler, S ^d  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b Taylor and Hobson Ltd   (United Kingdom)

^c Acru Works   (United Kingdom)

^d AWE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONDITION MONITORING; PRECISION ENGINEERING; TEXTURES;

DYNAMIC PERFORMANCE; GRATING STRUCTURES; LATERAL RESOLUTION; MEASUREMENT METHODS; MEASURING INSTRUMENTS; POSITIONAL ERRORS; SURFACE TEXTURE MEASUREMENT; TRACEABLE CALIBRATION;

PROBES;

EID: 84919919384     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. ISO 5436 (2000) Geometrical product specifications (GPS)-surface texture: Profile method-Measurement standards-Part 1 Material Measures
2. ISO TC213 working Group
3. J. Nunn Proceedings of the 4th Seminar on Quantitative Microscopy QM 2000, PTB-F-39, Braunschweig, (2000) 17-24
4. M. McCarthy Aspe 1996 Annual Meeting Proceedings Vol. 14 190