Some issues of traceability in the field of surface topography measurement

Wear

Volumn 257, Issue 12 SPEC.ISS., 2004, Pages 1246-1249

  Leach, Richard ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Microsystems; Softgauges; Surface metrology; Surface texture; Traceability

Indexed keywords

COMPUTATIONAL METHODS; MATHEMATICAL INSTRUMENTS; TEXTURES;

SURFACE TEXTURE PARAMETERS; TWO DIMENSIONAL (2D) PROFILING SYSTEMS;

SURFACE TOPOGRAPHY;

MEASUREMENT METHOD; TEXTURE; TOPOGRAPHY;

EID: 10044243579     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2004.06.004     Document Type: Conference Paper

References (17)

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