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Volumn 5, Issue , 2007, Pages 251-255

Thermal and mechanical analysis of high power leds with ceramic packages

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT EMITTING DIODES; MOLDS; THERMAL EXPANSION;

EID: 60449091636     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE200741759     Document Type: Conference Paper
Times cited : (6)

References (8)
  • 2
    • 31644441849 scopus 로고    scopus 로고
    • Thermal and mechanical analysis of delamination in GaN-based light-emitting diode packages
    • Jianzheng Hu, Lianqiao Yang, Woong Joon Hwang, and Moo Whan Shin, 2006, Thermal and mechanical analysis of delamination in GaN-based light-emitting diode packages, Journal of Crystal Growth, 288, pp. 157-161
    • (2006) Journal of Crystal Growth , vol.288 , pp. 157-161
    • Hu, J.1    Yang, L.2    Hwang, W.J.3    Shin, M.W.4
  • 3
    • 33846576199 scopus 로고    scopus 로고
    • Mechanism and thermal effect of delamination in light-emitting diode packages
    • Jianzheng Hu, Lianqiao Yang, and Moo Whan Shin, 2007, Mechanism and thermal effect of delamination in light-emitting diode packages, Microelectronics Journal, 38, pp. 157-163
    • (2007) Microelectronics Journal , vol.38 , pp. 157-163
    • Hu, J.1    Yang, L.2    Shin, M.W.3
  • 4
    • 0028405247 scopus 로고
    • A review of the Nd: YAG laser marking of plastic and ceramic IC packages
    • Yusoff Md. Noor, S. C. Tam, L. E. N. Lim, and S. Jana, 1994, A review of the Nd: YAG laser marking of plastic and ceramic IC packages J. Materials Processing Technology, 42, pp.95-133
    • (1994) J. Materials Processing Technology , vol.42 , pp. 95-133
    • Noor, Y.M.D.1    Tam, S.C.2    Lim, L.E.N.3    Jana, S.4
  • 6
    • 0024069775 scopus 로고
    • Fine structure of heat flow path in semiconductor devices: A measurement and identification method
    • V. Székely and Tran Van Bien, 1988, Fine structure of heat flow path in semiconductor devices: a measurement and identification method, Solid-State Electronics, 31, pp.1363-1368
    • (1988) Solid-State Electronics , vol.31 , pp. 1363-1368
    • Székely, V.1    Van Bien, T.2
  • 7
    • 0041163510 scopus 로고    scopus 로고
    • A new evaluation method of thermal transient results
    • V. Székely, 1997, A new evaluation method of thermal transient results, Microelectronics Journal, 28, pp.277-292
    • (1997) Microelectronics Journal , vol.28 , pp. 277-292
    • Székely, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.