Photoinduced effects in thin films of Te20 As30 Se50 glass with nonlinear characterization

Applied Physics Letters

Volumn 94, Issue 6, 2009, Pages

  Fedus, K ^a   Boudebs, G ^a   De Araújo, Cid B ^b   Cathelinaud, M ^c,d   Charpentier, F ^e   Nazabal, V ^e  

^a UNIVERSITÉ D'ANGERS   (France)

^b FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

^c AIX MARSEILLE UNIVERSITY   (France)

^d UPS CNRS 2274   (France)

^e INSTITUT DES SCIENCES CHIMIQUES DE RENNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; GLASS; IMAGING TECHNIQUES; PULSED LASER APPLICATIONS; REFRACTIVE INDEX; SEMICONDUCTING SELENIUM COMPOUNDS; TELLURIUM COMPOUNDS;

ABLATED REGIONS; CHALCOGENIDE GLASS; NON-LINEAR IMAGING TECHNIQUES; NONLINEAR ABSORPTION COEFFICIENTS; NONLINEAR CHARACTERIZATIONS; NONLINEAR REFRACTIVE INDICES; PHASE OBJECTS; PHOTO-INDUCED EFFECTS; PICOSECOND LASER PULSE; Z-SCAN TECHNIQUES;

LASER PULSES;

EID: 60349098208     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3082083     Document Type: Article

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