Nonlinear refraction measurements in presence of nonlinear absorption using phase object in a 4f system

Optics Communications

Volumn 250, Issue 4-6, 2005, Pages 416-420

  Boudebs, G ^a   Cherukulappurath, S ^a  

^a UNIVERSITÉ D'ANGERS   (France)

Author keywords

4f imaging system; Nonlinear refractive index; Z scan technique

Indexed keywords

BESSEL FUNCTIONS; COMPUTER SIMULATION; DISPERSIONS; IMAGE PROCESSING; LIGHT ABSORPTION; PHASE TRANSITIONS; PHOTONS; REFRACTIVE INDEX;

4F IMAGING SYSTEM; NONLINEAR REFRACTIVE INDEX; PHOTO-INDUCED EFFECTS; Z-SCAN TECHNIQUE;

IMAGING SYSTEMS;

EID: 19344369794     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.02.026     Document Type: Article

References (9)

1. G. Boudebs, and S. Cherukulappurath Phys. Rev. A 69 2004 053813
2. M. Sheik-Bahae, A.A. Said, T.H. Wei, D. Hagan, and E.W. Stryland IEEE J. Quantum Electron. 26 1990 760
3. G. Boudebs, and Cid B. de Araújo Appl. Phys. Lett. 85 17 2004 3740
4. G. Boudebs, F. Sanchez, J. Troles, and F. Smektala Opt. Commun. 199 5-6 2001 425
5. Y.R. Shen Nonlinear optics 1984 Wiley New York
6. J.W. Goodman Introduction to fourier optics second ed. 1996 Mc Graw Hill New York p. 221
7. J.A. Hermann J. Opt. Soc. Am. B 1 1984 729
8. S. Cherukulappurath, M. Guignard, F. Smektala, and G. Boudebs Opt. Commun. 242 1-3 2004 313
9. R.E. Bridges, G.L. Fischer, and R.W. Boyd Opt. Lett. 20 17 1995 1821