Linear optical effects in z-scan measurements of thin films

Applied Optics

Volumn 37, Issue 10, 1998, Pages 1854-1857

  Patterson, Brian M ^a   White, W Roc ^a   Robbins, Todd A ^a   Knize, Randall J ^a  

^a UNITED STATES AIR FORCE ACADEMY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000415343     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.001854     Document Type: Article

References (9)

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