SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 20, Issue 4, 2009, Pages 319-322

Microstructure, optical and dielectric properties of compositional graded (Ba,Sr)TiO 3 thin films derived by RF magnetron sputtering

(6) Wang, Jun a Xiang, Junhuai a Duo, Shuwang a Li, Wenkui a Li, Mingsheng a Bai, Lingyun a

a JIANGXI SCIENCE AND TECHNOLOGY NORMAL UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE VALUES; BAND GAPS; BST FILMS; BST THIN FILMS; DIELECTRIC CONSTANTS; DIELECTRIC MEASUREMENTS; FUSED QUARTZ; LOSS FACTORS; OPTICAL AND DIELECTRIC PROPERTIES; OPTICAL BAND-GAP; PREFERRED ORIENTATIONS; RF- MAGNETRON SPUTTERING; ROOM TEMPERATURES; SI SUBSTRATES; SPECTROPHOTOMETRIC MEASUREMENTS; X-RAY DIFFRACTIONS;

BARIUM; CERAMIC CAPACITORS; DIELECTRIC PROPERTIES; ENERGY GAP; LIGHT REFRACTION; MAGNETRON SPUTTERING; MAGNETRONS; MICROSTRUCTURE; OXIDE MINERALS; QUARTZ; REAL TIME SYSTEMS; REFRACTIVE INDEX; REFRACTOMETERS; THIN FILMS; X RAY ANALYSIS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 59749084552 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-008-9727-9 Document Type: Article

Times cited : (5)

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