-
1
-
-
18444408623
-
Method for fabricating multi-layer optical films,
-
U.S. Patent 4142958, March 6
-
D. T. Wei and A. W. Louderback, "Method for fabricating multi-layer optical films," U.S. Patent 4142958, March 6, 1979.
-
(1979)
-
-
Wei, D.T.1
Louderback, A.W.2
-
2
-
-
85076590849
-
Historical perspective on fifteen years of laser damage thresholds at LLNL
-
H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam and M. J. Soileau, Eds, Proc. Soc. Photo-Opt Instrum. Eng
-
F. Rainer, F. P. DeMarco, M. C. Staggs, M. R. Kozlowski, L. J. Atherton, and L. M. Sheehan, "Historical perspective on fifteen years of laser damage thresholds at LLNL," in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam and M. J. Soileau, Eds., Proc. Soc. Photo-Opt Instrum. Eng. 2114, 9-24 (1993).
-
(1993)
Laser-Induced Damage in Optical Materials: 1993
, vol.2114
, pp. 9-24
-
-
Rainer, F.1
DeMarco, F.P.2
Staggs, M.C.3
Kozlowski, M.R.4
Atherton, L.J.5
Sheehan, L.M.6
-
3
-
-
0027800303
-
Damage threshold study of ion beam sputtered coatings for a visible high-repetition laser at LLNL
-
H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam and M. J. Soileau, Eds, Proc. Soc. Photo-Opt Instrum. Eng
-
C. J. Stolz and J. R. Taylor, "Damage threshold study of ion beam sputtered coatings for a visible high-repetition laser at LLNL," in Laser-Induced Damage in Optical Materials: 1992, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam and M. J. Soileau, Eds., Proc. Soc. Photo-Opt Instrum. Eng. 1848, 182-190 (1992).
-
(1992)
Laser-Induced Damage in Optical Materials: 1992
, vol.1848
, pp. 182-190
-
-
Stolz, C.J.1
Taylor, J.R.2
-
4
-
-
85055212299
-
Measurement of ultralow losses in dielectric mirrors
-
Optical Society of America, Washington, D.C
-
R. Lalezari, G. Rempe, R. J. Thompson, and H. J. Kimble, "Measurement of ultralow losses in dielectric mirrors," in Optical Interference Coatings Technical Digest 1992, (Optical Society of America, Washington, D.C.), Vol. 15, 331-333 (1992).
-
(1992)
Optical Interference Coatings Technical Digest 1992
, vol.15
, pp. 331-333
-
-
Lalezari, R.1
Rempe, G.2
Thompson, R.J.3
Kimble, H.J.4
-
5
-
-
57849163903
-
Reactively sputtered optical coatings for use at 1064 nm
-
H. E. Bennett, A. J. Glass, A. H. Guenther, and B. E. Newnam, Eds, NBS Spec. PubI
-
W. T. Pawlewicz, R. Busch, D. D. Hays, P. M. Martin, and N. Laegreid, "Reactively sputtered optical coatings for use at 1064 nm," in Laser-Induced Damage in Optical Materials: 1979, H. E. Bennett, A. J. Glass, A. H. Guenther, and B. E. Newnam, Eds., NBS Spec. PubI. 568, 359-374 (1979).
-
(1979)
Laser-Induced Damage in Optical Materials: 1979
, vol.568
, pp. 359-374
-
-
Pawlewicz, W.T.1
Busch, R.2
Hays, D.D.3
Martin, P.M.4
Laegreid, N.5
-
6
-
-
0027153699
-
Structural influences on the laser damage thresholds of oxide coatings
-
K. H. Guenther, Ed, Proc. Soc. Photo-Opt Instrum. Eng
-
E. Hacker, H. Lauth, P. Weißbrodt, R. Wolf, "Structural influences on the laser damage thresholds of oxide coatings," in Thin Films for Optical Systems, K. H. Guenther, Ed., Proc. Soc. Photo-Opt Instrum. Eng. 1782, 447-458 (1992).
-
(1992)
Thin Films for Optical Systems
, vol.1782
, pp. 447-458
-
-
Hacker, E.1
Lauth, H.2
Weißbrodt, P.3
Wolf, R.4
-
7
-
-
0025496970
-
Expanded damage test facilities at LLNL
-
H. E. Bennett, L. L. Chase, A. H. Guenther, B. B. Newnam and M. J. Soileau, Eds, NIST Spec. Publ, Proc. Soc. Photo-Opt Instrum. Eng. 1438
-
A. J. Morgan, F. Rainer, F. P. DeMarco, F. P. Gonzales, M. R. Kozlowski, and M. C. Staggs, "Expanded damage test facilities at LLNL," in Laser-induced Damage in Optical Materials: 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. B. Newnam and M. J. Soileau, Eds., NIST Spec. Publ. 801, Proc. Soc. Photo-Opt Instrum. Eng. 1438, 47-57 (1989).
-
(1989)
Laser-induced Damage in Optical Materials: 1989
, vol.801
, pp. 47-57
-
-
Morgan, A.J.1
Rainer, F.2
DeMarco, F.P.3
Gonzales, F.P.4
Kozlowski, M.R.5
Staggs, M.C.6
-
9
-
-
57849119496
-
-
R. Alani, R. G. Harper and P. R. Swann, Ion thinning of TEM cross sections under beam switching control, Proceeding from the 50th Meeting of the Electron Microscopy, Soc. of America, G.W. Bailey ed., San Francisco Press, S.F., CA, pp. 394-5 (1992).
-
R. Alani, R. G. Harper and P. R. Swann, "Ion thinning of TEM cross sections under beam switching control," Proceeding from the 50th Meeting of the Electron Microscopy, Soc. of America, G.W. Bailey ed., San Francisco Press, S.F., CA, pp. 394-5 (1992).
-
-
-
-
10
-
-
0027872775
-
Photothermal characterization of optical thin films
-
Z. L. Wu, P. K. Kuo, L. Wei, S. L. Gu, R. L. Thomas, "Photothermal characterization of optical thin films," Thin Solid Films 236, p. 191-198 (1993).
-
(1993)
Thin Solid Films
, vol.236
, pp. 191-198
-
-
Wu, Z.L.1
Kuo, P.K.2
Wei, L.3
Gu, S.L.4
Thomas, R.L.5
-
11
-
-
0029492406
-
Failure characterization of nodular defects in multi-layer dielectric coatings
-
H. B. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds, Proc. Soc. Photo-Opt Instrum. Eng
-
R. H. Sawicki, C. C Shang, and T. L. Swatlowski, "Failure characterization of nodular defects in multi-layer dielectric coatings," in Laser-Induced Damage in Optical Materials: 1994, H. B. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. Soc. Photo-Opt Instrum. Eng. 2428, 333-342 (1994).
-
(1994)
Laser-Induced Damage in Optical Materials: 1994
, vol.2428
, pp. 333-342
-
-
Sawicki, R.H.1
Shang, C.C.2
Swatlowski, T.L.3
-
12
-
-
0028745062
-
Large area conditioning of optics for high-power laser systems
-
H. E. Bennett, A. H. Guenther, L. L. Chase, B. E. Newnam, and M. J. Soileau, eds, Proc. Soc. Photo-Opt Instrum. Eng
-
L. M. Sheehan, M. R. Kozlowski,F. Rainer, M. C. Staggs, "Large area conditioning of optics for high-power laser systems," in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, A. H. Guenther, L. L. Chase, B. E. Newnam, and M. J. Soileau, eds., Proc. Soc. Photo-Opt Instrum. Eng. 2114, 333-342 (1993).
-
(1993)
Laser-Induced Damage in Optical Materials: 1993
, vol.2114
, pp. 333-342
-
-
Sheehan, L.M.1
Kozlowski, M.R.2
Rainer, F.3
Staggs, M.C.4
-
13
-
-
57849097720
-
A comparison of nodular defect seed geometeries from different deposition techniques
-
H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. B. Newnam, and M. J. Soileau, eds, Proc. Soc. Photo-Opt Instrum. Eng, to be published
-
C. J. Stolz, R. J. Tench, M. R. Kozlowski, and A. Fornier, "A comparison of nodular defect seed geometeries from different deposition techniques," in Laser-Induced Damage in Optical Materials: 1995, H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. B. Newnam, and M. J. Soileau, eds., Proc. Soc. Photo-Opt Instrum. Eng., 2714, to be published.
-
Laser-Induced Damage in Optical Materials: 1995
, vol.2714
-
-
Stolz, C.J.1
Tench, R.J.2
Kozlowski, M.R.3
Fornier, A.4
|