Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light

Materials Science and Engineering: A

Volumn 503, Issue 1-2, 2009, Pages 10-13

  Kilmametov, A R ^a   Vaughan, G ^b   Yavari, A R ^c   LeMoulec, A ^c   Botta, W J ^d   Valiev, R Z ^a  

^a Birsk Branch of Federal State Budgetary Educational Establishment of Higher Education Bashkir State University   (Russian Federation)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIV GRENOBLE ALPES   (France)

^d FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

High pressure torsion; Severe plastic deformation; Synchrotron light; Ultrafine grained copper; X ray diffraction

Indexed keywords

COPPER; CRYSTAL LATTICES; MICROSTRUCTURE; PLASTIC DEFORMATION; SYNCHROTRON RADIATION; SYNCHROTRONS; TORSIONAL STRESS; UNLOADING;

BRAGG CRYSTALS; HIGH ENERGY SYNCHROTRON; HIGH PRESSURE TORSIONS; IN-SITU X-RAY DIFFRACTION; MICROSTRUCTURE EVOLUTIONS; MONOCHROMATICS; SEVERE PLASTIC DEFORMATIONS; SYNCHROTRON LIGHT; ULTRAFINE-GRAINED COPPER; X- RAY DIFFRACTIONS;

X RAY DIFFRACTION;

EID: 59349091821     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2008.11.023     Document Type: Article

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