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Nanoscale Research Letters

Volumn 4, Issue 1, 2009, Pages 90-93

The effect of interface texture on exchange biasing in Ni 80Fe 20/Ir 20Mn 80 system

(1) Chen, Yuan Tsung a

a I SHOU UNIVERSITY (Taiwan)

Author keywords

Coupling or decoupling effect; Exchange biasing; Texture

Indexed keywords

(111) TEXTURE; ANTIFERROMAGNETIC (AFM); COERCIVITY; COUPLING OR DECOUPLING EFFECT; EXCHANGE BIASING; EXCHANGE ENERGIES; LOOP SHIFTING; RANDOM ACCESS MEMORIES; SPIN COUPLINGS; TEXTURE; X RAY DIFFRACTION (XRD);

ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; ELECTRIC RESISTANCE; HIGH RESOLUTION ELECTRON MICROSCOPY; HYSTERESIS; INTERFACIAL ENERGY; IRIDIUM; IRIDIUM COMPOUNDS; MAGNETIC FIELD EFFECTS; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MANGANESE; MANGANESE COMPOUNDS; RANDOM ACCESS STORAGE; SPIN DYNAMICS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 58549089683 PISSN: 19317573 EISSN: 1556276X Source Type: Journal
DOI: 10.1007/s11671-008-9207-4 Document Type: Article

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.