Structural and optical characterization of thermally evaporated cadmium sulfide thin films

Surface and Interface Analysis

Volumn 41, Issue 1, 2009, Pages 61-68

  Derin, H ^a   Kantarli, K ^b  

^a ADNAN MENDERES UNIVERSITY   (Turkey)

^b EGE UNIVERSITY   (Turkey)

Author keywords

Cadmium sulfide; Coatings; Ellipsometry; Optical properties; X ray

Indexed keywords

BAND STRUCTURE; CADMIUM COMPOUNDS; DATA STORAGE EQUIPMENT; ELLIPSOMETRY; ENERGY GAP; LATTICE CONSTANTS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFLECTION; SEMICONDUCTING CADMIUM COMPOUNDS; SOLIDS; SPECTROSCOPIC ELLIPSOMETRY; THERMAL EVAPORATION; THIN FILM DEVICES; THIN FILMS; X RAY ANALYSIS; ZINC;

AB SORPTION COEFFICIENTS; CADMIUM SULFIDE; CDS THIN FILMS; COATINGS; ENERGY BANDS; GOLD SUBSTRATES; ROOM-TEMPERATURE (RT); X RAY DIFFRACTION (XRD); X-RAY;

CADMIUM;

EID: 58449130497     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2990     Document Type: Article

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