Shunting problems due to sub-micron pinholes in evaporated solid-phase crystallised poly-Si thin-film solar cells on glass

Progress in Photovoltaics: Research and Applications

Volumn 17, Issue 1, 2009, Pages 35-46

  Kunz, O ^a   Wong, J ^a   Janssens, J ^a   Bauer, J ^b   Breitenstein, O ^b   Aberle, A G ^a,c  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Lock in thermography; Metallisation; Polycrystalline silicon; Shunting; Solid phase crystallisation; Thin film solar cells

Indexed keywords

AMORPHOUS FILMS; AMORPHOUS MATERIALS; CRYSTALLIZATION; ETCHING; GLASS; IMAGE ENHANCEMENT; PHOTOVOLTAIC CELLS; POLYCRYSTALLINE MATERIALS; POLYSILICON; REMOTE SENSING; SEMICONDUCTING SILICON COMPOUNDS; SOLAR CELLS; SOLAR EQUIPMENT; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT); THIN FILM DEVICES;

LOCK-IN THERMOGRAPHY; METALLISATION; POLYCRYSTALLINE SILICON; SHUNTING; THIN-FILM SOLAR CELLS;

AMORPHOUS SILICON;

EID: 58149523827     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.866     Document Type: Article

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