Shunt-analysis of epitaxial silicon thin-film solar cells by lock-in thermography

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 1335-1338

  Bau, Sandra ^a   Huljić, Dominik M ^a   Isenberg, Jörg ^a   Rentsch, Jochen ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH FROM MELT; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; EPITAXIAL GROWTH; LEAKAGE CURRENTS; MICROSCOPIC EXAMINATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING SILICON; SINGLE CRYSTALS; THERMOGRAPHY (IMAGING); THIN FILM DEVICES; VOLTAGE MEASUREMENT;

MONOCRYSTALLINE SILICON; MULTICRYSTALLINE SILICON; SHUNT ANALYSIS; THIN-FILM SOLAR CELL;

SILICON SOLAR CELLS;

EID: 0036953459     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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