A study of core and valence levels in β-PbO2 by hard X-ray photoemission

Journal of Electron Spectroscopy and Related Phenomena

Volumn 169, Issue 1, 2009, Pages 26-34

  Payne, D J ^a   Paolicelli, G ^b   Offi, F ^c   Panaccione, G ^d   Lacovig, P ^e   Beamson, G ^f   Fondacaro, A ^g   Monaco, G ^g   Vanko, G ^g   Egdell, R G ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b INFM   (Italy)

^c ROMA TRE UNIVERSITY   (Italy)

^d LABORATORIO TASC   (Italy)

^e SINCROTRONE TRIESTE   (Italy)

^f DARESBURY LABORATORY   (United Kingdom)

^g EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Core hole screening; Electronic structure; HXPS; Lead dioxide; Plasmon; Recoil

Indexed keywords

BINDING ENERGY; ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; LEAD; LEAD ALLOYS; PHOTOELECTRICITY; PHOTOEMISSION; PLASMONS;

CORE LEVELS; CORE-HOLE SCREENING; FINAL STATES; HXPS; LEAD DIOXIDE; MAXIMUM AMPLITUDES; PARTIAL DENSITY OF STATES; PHOTOEMISSION SPECTROSCOPIES; PHOTON ENERGIES; RECOIL; RECOIL EFFECTS; S CHARACTERS; SURFACE REGIONS; VALENCE LEVELS;

EMISSION SPECTROSCOPY;

EID: 58149507800     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2008.10.002     Document Type: Article

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