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Volumn 77, Issue 12, 2008, Pages

Analysis of surface-bulk screening competition in the electron-doped Nd2-x Cex CuO4 cuprate using x-ray photoemission spectroscopy

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EID: 41549159778     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.125133     Document Type: Article
Times cited : (16)

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    • The error introduced in the normalization to the same area by the integral background subtraction is <5%.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.