Controlling high-mobility conduction in SrTiO3 by oxide thin film deposition

Applied Physics Letters

Volumn 94, Issue 1, 2009, Pages

  Herranz, G ^a,b   Basletic M ^a,c   Copie, O ^a   Bibes, M ^a   Khodan, A N ^a,d   Carrtro C ^a   Tafra, E ^c   Jacquet, E ^a   Bouzehouane, K ^a   Hamzic A ^c   Barthlmy A ^a  

^a CNRS   (France)

^b CSIC   (Spain)

^c UNIVERSITY OF ZAGREB   (Croatia)

^d FRUMKIN INSTITUTE OF PHYSICAL CHEMISTRY AND ELECTROCHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

OXYGEN VACANCIES; PULSED LASER DEPOSITION; SINGLE CRYSTALS; STRONTIUM TITANATES; TITANIUM COMPOUNDS; VACANCIES;

LOW CONCENTRATIONS; LOW OXYGEN PRESSURE; METALLIC CONDUCTOR; MULTIFUNCTIONAL OXIDES; OXIDE THIN FILMS; SINGLE CRYSTAL SUBSTRATES; THICKNESS OF OXIDE FILM; VACANCY CONCENTRATION;

OXIDE FILMS;

EID: 58149504130     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3063026     Document Type: Article

References (17)

1. T. Dürkop, S. Getty, E. Cobas, and M. Fuhrer, Nano Lett. 1530-6984 10.1021/nl034841q 4, 35 (2004).
2. M. Katsnelson, Mater. Today 1369-7021 10.1016/S1369-7021(06)71788-6 10, 20 (2007).
3. A. Tsukazaki, A. Ohtomo, T. Kita, Y. Ohno, H. Ohno, and M. Kawasaki, Science 0036-8075 10.1126/science.1137430 315, 1388 (2007).
4. J. A. Noland, Phys. Rev. 94, 724 (1954).
5. H. P. R. Frederikse and W. R. Hosler, Phys. Rev. 161, 822 (1967).
6. G. Herranz, M. Basletic, M. Bibes, R. Ranchal, A. Hamzic, E. Tafra, K. Bouzehouane, E. Jacquet, J. P. Contour, A. Barth́ĺmy, and A. Fert, Phys. Rev. B 0163-1829 10.1103/PhysRevB.73.064403 73, 064403 (2006).
7. G. Herranz, M. Basletic, M. Bibes, C. Carŕt́ro, E. Tafra, E. Jacquet, K. Bouzehouane, C. Deranlot, A. Hamzic, J. -M. Broto, A. Barth́ĺmy, and A. Fert, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.98.216803 98, 216803 (2007).
8. M. Basletic, J. -L. Maurice, C. Carŕt́ro, G. Herranz, O. Copie, M. Bibes, E. Jacquet, K. Bouzehouane, S. Fusil, and A. Barth́ĺmy, Nature Mater. 1476-1122 10.1038/nmat2223 7, 621 (2008).
9. P. Erhart and K. Albe, J. Appl. Phys. 0021-8979 10.1063/1.2956327 104, 044315 (2008).
10. The estimation of EC does not depend on the number of carriers per vacancy, provided that this ratio does not change with the annealing temperature.
11. T. Tanaka, K. Matsunaga, Y. Ikuhara, and T. Yamamoto, Phys. Rev. B 0163-1829 10.1103/PhysRevB.68.205213 68, 205213 (2003).
12. T. Ishigaki, S. Yamauchi, J. Mizusaki, K. Fueki, and H. Tamura, J. Solid State Chem. 0022-4596 10.1016/0022-4596(84)90136-1 54, 100 (1984).
13. M. N. Alexander and D. F. Holcomb, Rev. Mod. Phys. 0034-6861 10.1103/RevModPhys.40.815 40, 815 (1968).
14. A. N. Khodan, S. Guyard, J. -P. Contour, D. -G. Cŕt́, E. Jacquet, and K. Bouzehouane, Thin Solid Films 0040-6090 10.1016/j.tsf.2006.11. 099 515, 6422 (2007).
15. D. W. Reagor and V. Y. Butko, Nature Mater. 1476-1122 10.1038/nmat1402 4, 593 (2005).
16. A. Uedono, K. Shimayama, M. Kiyohara, Z. Q. Chen, and K. Yamabe, J. Appl. Phys. 0021-8979 10.1063/1.1498889 92, 2697 (2002).
17. T. Ohnishi, K. Shibuya, T. Yamamoto, and M. Lippmaa, J. Appl. Phys. 0021-8979 10.1063/1.2921972 103, 103703 (2008).