Wavelet denoising applied to free-space reflection measurements

Measurement Science and Technology

Volumn 19, Issue 11, 2008, Pages

  Nakhkash, Mansor ^a   Mirzaei, Ahmad ^a  

^a YAZD UNIVERSITY   (Iran)

Author keywords

Dielectric properties; Free space measurement; Time gating; Wavelet denoising

Indexed keywords

MEASUREMENT THEORY; MEASUREMENTS;

FREE SPACE MEASUREMENTS; FREE SPACES; REFLECTION MEASUREMENTS; SINGLE LAYER; SYNTHETIC DATA; TIME GATING; WAVELET DENOISING; WAVELET DENOISING ALGORITHM;

DIELECTRIC PROPERTIES;

EID: 58149306134     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/11/115706     Document Type: Article

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