High resolution x-ray fluorescence measurements using a flat analyzer crystal and an x-ray ccd

Journal of Trace and Microprobe Techniques

Volumn 19, Issue 4, 2001, Pages 615-621

  Hayakawa, Shinjiro ^a   Kagoshima, Yasushi ^b   Tsusaka, Yoshiyuki ^b   Matsui, Junji ^b   Hirokawa, Takeshi ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

^b UNIVERSITY OF HYOGO   (Japan)

Author keywords

CCD; Synchrotron radiation; Wavelength dispersive spectrometer; X ray fluorescence

Indexed keywords

EID: 31244435977     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: 10.1081/TMA-100107596     Document Type: Article

References (6)

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2. Janssens, K.H.A.; Adams, F.C.V.; Rindby, A. Microscopic X-ray Fluorescence Analysis. Wiley, Chichester, 2000.
3. Ohashi, K.; Takahashi, M.; Gohshi, Y.; lida, A.; Kishimoto, S. Synchrotron Radiation X-ray Fluorescence Analysis With a Crystal Spectrometer. Adv. X-ray Anal. 1992, 55, 1027-1033.
4. Hayakawa, S.; Yamaguchi, A.; Hong, W.; Gohshi, Y.; Yamamoto, T.; Hayashi, K.; Kawai, J.; Goto, S. A Wavelength Dispersive X-ray Spectrometer for Small Area X-ray Fluorescence Spectroscopy at SPring-8 BL39XU. Spectrochim Acta 1999, 54B, 171-177.
5. Hayakawa, S.; Ikuta, N.; Suzuki, M.; Wakatsuki, M.; Hirokawa, T. Generation of an X-ray Microbeam for Spectromicroscopy at SPring-8 BL39XU. J. Synchrotron Rad. 2001, 8, 328-330.
6. Tsusaka, Y.; Yokoyama, K.; Takai, K.; Takeda, S.; Kagoshima, Y.; Matsui, J. Hyogo Beamline at SPring-8: Multiple Station Beamline with the Troika Concept. Nucl. Instrum. Methods Phys. Res. A 2001, (in press).