A Large-Aperture X-Ray Monochromator with Stepped Surface

Instruments and Experimental Techniques

Volumn 45, Issue 6, 2002, Pages 819-823

  Latush, E M ^a   Mazuritsky, M I ^a   Soldatov, A V ^a   Marcelli, A ^b  

^a SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^b INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0442263381     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021447525899     Document Type: Article

References (8)

1. Bonnelle, C. and Mande, C., Advances in X-Ray Spectroscopy, Oxford: Pergamon, 1982.
2. Reed, S.J.B., Electron Microprobe Analysis, Cambridge: Cambridge Univ. Press, 1997, p. 319.
3. Mazuritskii, M.I., Soldatov, A.V., Latush, E.M., and Lyashenko, V.L., Pis'ma Zh. Tekh. Fiz., 1999, vol. 25, no. 19, p. 11.
4. Wittry, D.B. and Sun, D.B., J. Appl. Phys., 1990, vol. 67, no. 4, p. 1633.
5. Fraenkel, B.S., Bitter, M., von Goeler, S., et al., J. X-Ray Sci. Technol., 1997, vol. 7, p. 171.
6. Marcelli, A., Soldatov, A.V., and Mazuritsky, M.I., UE Patent no. 97830282.6-220, 1997 (Jpn. Patent no. 339424/97, 1997; US Patent no. 09/063482, 1998).
7. Mazuritskii, M.I., Latush, E.M., Soldatov, A.V., et al., Pis'ma Zh. Tekh. Fiz., 2000, vol. 26, no. 12, p. 15.
8. Mazuritskii, M.I., Soldatov, A.V., Lyashenko, V.L., et al., Pis'ma Zh. Tekh. Fiz., 2001, vol. 27, no. 1, p. 22.