Lattice parameters, deviations from Vegard's rule, and E2 phonons in InAlN

Applied Physics Letters

Volumn 93, Issue 26, 2008, Pages

  Darakchieva, V ^a,b   Xie, M Y ^b   Tasnadi F ^b   Abrikosov, I A ^b   Hultman, L ^b   Monemar, B ^b   Kamimura, J ^c   Kishino, K ^c,d  

^a Instituto Technológico E Nuclear   (Portugal)

^b LINKÖPING UNIVERSITY   (Sweden)

^c SOPHIA UNIVERSITY   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; INDIUM; LATTICE CONSTANTS; PHONONS; X RAY ANALYSIS; X RAY DIFFRACTION;

BOWING PARAMETERS; COMPOSITIONAL RANGES; IN COMPOSITIONS; LATTICE PARAMETERS; NANO COLUMNS; PHONON FREQUENCIES; X-RAY DIFFRACTIONS;

REAL TIME SYSTEMS;

EID: 58149262895     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3056656     Document Type: Article

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