A calculation of backscattering factor database for quantitative analysis by Auger electron spectroscopy

Journal of Applied Physics

Volumn 104, Issue 11, 2008, Pages

  Zeng, R G ^a   Ding, Z J ^a   Li, Y G ^a   Mao, S F ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AUGERS; BACKSCATTERING; COPPER; DATABASE SYSTEMS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SPECTROSCOPY; ELECTRONS; EMISSION SPECTROSCOPY; IONIZATION; MONTE CARLO METHODS; SCATTERING; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTING SILICON COMPOUNDS; SILVER; SYSTEMS ENGINEERING;

AUGER ELECTRONS; AUGER TRANSITIONS; BACKSCATTERING FACTORS; CYLINDRICAL MIRROR ANALYZERS; EMISSION ANGLES; HEMISPHERICAL ANALYZERS; INCIDENT ANGLES; IONIZATION CROSS SECTIONS; MONTE CARLO MODELS; MONTE CARLO SIMULATION METHODS; NUMBER OF ELECTRONS; NUMERICAL VALUES; ONLINE DATABASES; PRIMARY ELECTRON BEAMS; PRIMARY ENERGIES; PURE ELEMENTS; QUANTITATIVE ANALYSES; SHELL IONIZATIONS; STATISTICAL ERRORS; THRESHOLD ENERGIES;

AUGER ELECTRON SPECTROSCOPY;

EID: 58149242219     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3041654     Document Type: Article

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