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Volumn 89, Issue 12, 2006, Pages

Mechanism and scalability in resistive switching of metal-Pr 0.7Ca 0.3MnO 3 interface

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DENSITY; INTERFACE TREATMENTS; SCALABILITY;

EID: 33748954307     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2349312     Document Type: Article
Times cited : (29)

References (19)
  • 10
    • 33748985794 scopus 로고    scopus 로고
    • Thin Solid Films 486, 24 (2005).
    • (2005) Thin Solid Films , vol.486 , pp. 24


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.