Structural, optical and magnetic properties of Co-doped ZnO nanorods with hidden secondary phases

Nanotechnology

Volumn 19, Issue 45, 2008, Pages

  Wang, Xuefeng ^a,b,c   Zheng, Rongkun ^a   Liu, Zongwen ^a   Ho, Ho Pui ^b   Xu, Jianbin ^b   Ringer, Simon P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^c SOOCHOW UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COBALT; CRYSTAL GROWTH; CRYSTALLIZATION; DOPING (ADDITIVES); FERROMAGNETISM; GRAIN BOUNDARIES; GROWTH (MATERIALS); HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTEGRATED OPTOELECTRONICS; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; NANORODS; OPTICAL MICROSCOPY; OSTWALD RIPENING; PHASE SEPARATION; PHOTOELECTRON SPECTROSCOPY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SPECTRUM ANALYSIS; SURFACE ACTIVE AGENTS; ZINC; ZINC OXIDE; ZINC SULFIDE;

C -AXIS; CHARACTERIZATION TECHNIQUES; CRYSTAL GROWTH MECHANISMS; DEFECT STATES; DILUTED MAGNETIC SEMICONDUCTORS; DOPING EFFECTS; EXCHANGE MECHANISMS; HIGH RESOLUTIONS; HYDROTHERMAL TECHNIQUES; MIXED CATIONS; OPTICAL-; PHASE SEGREGATIONS; PREFERENTIAL GROWTH DIRECTIONS; RAMAN SPECTROSCOPIC; SECONDARY PHASES; VIBRATING SAMPLE MAGNETOMETRIES; WURTZITE LATTICES; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; ZNO NANORODS;

X RAY PHOTOELECTRON SPECTROSCOPY;

CATION; FERROMAGNETIC MATERIAL; NANOROD; SURFACTANT; ZINC OXIDE;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; CRYSTALLIZATION; MAGNETISM; MORPHOLOGY; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 58149229577     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/45/455702     Document Type: Article

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