Effects of applied voltage on morphology and crystal orientation of Mg (OH)2 coating on PT by electrochemical synthesis

Journal of the Electrochemical Society

Volumn 156, Issue 2, 2009, Pages

  Li, Ching Fei ^a   Ho, Wen Hsien ^b   Yen, Shiow Kang ^a  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^b TAIWAN TEXTILE RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; MAGNESIUM; OZONE WATER TREATMENT; PLATINUM; SCANNING ELECTRON MICROSCOPY; THERMOANALYSIS; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

APPLIED VOLTAGES; DEPOSITION POTENTIALS; ELECTROCHEMICAL SYNTHESIS; ENVIRONMENTALLY BENIGN; HIGHLY DENSE; IR SPECTROSCOPIES; LOW COSTS; MAGNESIUM HYDROXIDES; MG ALLOYS; MICROARC OXIDATIONS; PREFERRED ORIENTATIONS; SURFACE APPEARANCES; UNIFORM COATINGS; X-RAY DIFFRACTIONS;

CRYSTAL ORIENTATION;

EID: 58049129225     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3032174     Document Type: Article

References (30)

1. F. Stippich, E. Vera, G. K. Wolf, G. Berg, and Chr. Friedrich, Surf. Coat. Technol., 103-104, 29 (1998).
2. K. H. Nam and J. G. Han, Surf. Coat. Technol., 171, 51 (2003).
3. J. H. Lee, J. H. Eun, S. Y. Park, S. G. Kim, and H. J. Kim, Thin Solid Films, 435, 95 (2005).
4. S. G. Kim, K. H. Choi, J. Hwan, H. J. Kim, and C. S. Hwang, Thin Solid Films, 377-378, 694 (2000).
5. A. I. Ektessabi, H. Nomura, N. Yasui, and Y. TsuKuda, Surf. Coat. Technol., 163-164, 728 (2003).
6. K. Oumi, H. Matsumoto, K. Kashiwagi, and Y. Murayama, Surf. Coat. Technol., 169-170, 562 (2003).
7. J. Y. Kim, H. S. Jung, and K. S. Hong, J. Am. Ceram. Soc., 88, 784 (2005).
8. C. Bondoux, P. Prence, P. Belleville, F. Guillet, S. Lanmbert, B. Miont, and R. Jerisian, J. Eur. Ceram. Soc., 25, 2795 (2005).
9. J. Liang, B. Guo, J. Tian, H. Liu, J. Zhou, W. Liu, and T. Xu, Surf. Coat. Technol., 199, 121 (2005).
10. H. Duan, K. Du, C. Yan, and F. Wang, Electrochim. Acta, 51, 2898 (2006).
11. Q. Cai, L. Wang, B. Wei, and Q. Liu, Surf. Coat. Technol., 200, 3727 (2006).
12. H. Guo, M. An, S. Xu, and H. Huo, Mater. Lett., 60, 1538 (2006).
13. G. H. Annal Therese and P. Vishnu Kamath, Chem. Mater., 12, 1195 (2000).
14. R. Liu, A. A. Vertegel, E. W. Bohannan, T. A. Sorenson, and J. A. Switzer, Chem. Mater., 13, 508 (2001).
15. Y. Zhou, R. J. Phillips, and J. A. Switzer, J. Am. Ceram. Soc., 78, 981 (1995).
16. L. Gal-Or, I. Silberman, and R. Chaim, J. Electrochem. Soc., 138, 1939 (1991).
17. S. K. Yen and C. C. Chang, Mater. Chem. Phys., 77, 836 (2003).
18. W. H. Ho and S. K. Yen, J. Electrochem. Soc., 152, A506 (2005).
19. G. H. Annal Therese and P. Vishnu Kamath, J. Appl. Electrochem., 28, 539 (1998).
20. M. Dinamani and P. Vishnu Kamath, J. Appl. Electrochem., 34, 899 (2004).
21. G. Zou, R. Liu, and W. Chen, Mater. Lett., 61, 1990 (2007).
22. G. Zou, W. Chen, R. Liu, and Z. Xu, Mater. Chem. Phys., 107, 85 (2008).
23. F. G. Cottrell, Z. Phys. Chem., Stoechiom. Verwandtschaftsl., 42, 385 (1902).
24. L. Qiu, R. Xie, P. Ding, and B. Qu, Compos. Struct., 62, 391 (2003).
25. J. Lv, L. Qiu, and B. Qu, Nanotechnology, 15, 1576 (2004).
26. J. K. Han, H. Y. Song, F. Saito, and B. T. Lee, Mater. Chem. Phys., 99, 235 (2006).
27. X. Lv, H. Bala, M. Li, X. Ma, S. Ma, Y. Gao, L. Tang, Y. Guo, X. Zhao, and Z. Wang, Colloids Surf., A, 296, 97 (2007).
28. E. F. Oliveira and Y. Hase, Vib. Spectrosc., 25, 53 (2001).
29. E. Martell and R. M. Smith, Critical Stability Constants, Vols. 3-6, Plenum, New York (1976-1989).
30. M. Catti, G. Ferraris, S. Hull, and A. Pavese, Phys. Chem. Miner., 22, 200 (1995).